In the framework of so-called mechanochemistry,
 mechanical force induced reactions have been studied using NCAFM.
 Recent works reported force induced atomic-scale switching,
 quantitative force measurements to induce the diffusion of single atoms
 and molecules,
 as well as studying molecular conformers
 and tautomerization.
 A few earlier studies also showed examples of mechanically induced vertical manipulation of single atoms. [8, 9] However, direct observation of mechanically induced covalent bonding of two different atoms using NC-AFM remain scarce.
Researchers report the first controlled vertical manipulation of a single H atom using the tip of an AFM sensor and its application in characterizing and engineering silicon DB-based structures of relevance to nanoelectronic devices.
They showed that following a tip induced desorption, a hydrogen atom can be deposited on the surface or transfered to the tip apex resulting in a H-functionalized tip. The physisorbed single hydrogen atom on the chemically inert H-Si surface could be stably imaged in STM and AFM modes. The H-functionalized tip was used to
(i) characterize silicon dangling bonds and